Our Services

Phasix ESD carry out ESD and Latch-up tests on semiconductor devices. Click here for a discussion about ESD and qualification test methods. Most commonly we are asked to test as part of a device qualification for quality and reliability but sometimes our customers need us to undertake some investigative work to establish the level and mechanism of a specific failure.

What you can expect from Phasix ESD

We understand the importance of speed! Our standard turnaround time is five working days from receipt of sample devices. We regularly return tested samples faster than this - please check with us if your requirements are very urgent. We will initially check with you precisely what kind of testing you require. If you want us to do investigative work we will ensure that your detailed instructions are followed. If you simply want us to test to a particular standard we are very happy to advise on the pin combinations, parameters and quantity of samples we will need.

We will write a specific test plan for our automated test equipment and will agree this with you before commencing testing on request. A typical test plan would involve testing a sample of three new devices at each stress level and contain tests as follows:

  1. Initial continuity test to check for device presence in the socket.
  2. Initial powered-down curve tracing for reference.
  3. Stressing according to the pingroups specified in the applicable standard, with post-stress powered-down curve tracing for comparison with the reference curve after each stress sequence on each pin.
  4. Reporting of the stress voltages and combinations carried out along with our "pass/fail" judgements. A "fail" will be reported where the post-stress curve is materially changed from the reference curve. Note that although we will not apply further stresses to pins which have been classed as failed we will continue to stress the other pins on the device unless otherwise instructed. Also, note that you should perform full functional and parametric testing on all devices within 48 hours of stressing to properly determine the outcome of a qualification test.

We will record reference ESD waveforms before and after testing to assure you that the equipment was fully operational and within specification for the duration of the test. On completion of the testing we will collate the results we have obtained into a report which we will make available as a pdf file. We will also package up the raw files created by our tester (including results, curves etc.) onto a CD which we will send to you.

We will package up and send back your parts as soon as practicable after the testing is completed, and certainly before the end of the next working day.

Standards which we can test to include:

HBM Mil-Std 883G Method 3015.7 (ISO17025)
  Mil-Std 883H Method 3015.8 (ISO17025)
  Mil-Std 883J Method 3015.9 (ISO17025)
  ANSI/ESDA/JEDEC JS-001-2012(ISO17025)
  ANSI/ESDA/JEDEC JS-001-2011(ISO17025)
  ANSI/ESDA/JEDEC JS-001-2010(ISO17025)
  EIA/JESD22-A114-F (ISO17025)
  AEC-Q100-002-REV-E (ISO17025)
  AEC-Q100-002-REV-D (ISO17025)
  AEC-Q101-001-REV-A (ISO17025)
  ANSI/ESD STM5.1-2007  
  ESCC Basic Specification No. 23800 
  FOTP-129 (GR 468)  
MM  EIA/JESD22-A115-A (ISO17025)
  EIA/JESD22-A115-C (ISO17025)
  AEC-Q100-003 REV-E (ISO17025)
  AEC-Q101-002-REV-A (Discretes)
  ANSI/ESD STM5.2-2009  
  ANSI/ESD STM5.2-1999  
CDM JESD22-C101F (ISO17025)
  JESD22-C101E (ISO17025)
  JESD22-C101D (ISO17025)
  JESD22-C101C (ISO17025)
  AEC-Q100-011 Rev-C1 (ISO17025)
  AEC-Q100-011 Rev-B (ISO17025)
  AEC-Q101-005-REV (ISO17025)
  ANSI/ESD STM5.3.1-2009  
  ANSI/ESD STM5.3.1-1999  
Latch-Up JESD78D 
  JESD78C  
  JESD78B  
  JESD78A  
  JESD78  

We are accredited to UKAS ISO17025, UKAS Testing Laboratory No. 4670 for the indicated testing standards and certified to ISO9001:2008 for the remainder.