Phasix ESD carry out ESD and Latch-up tests on semiconductor devices. Click here for a discussion about ESD and qualification test methods. Most commonly we are asked to test as part of a device qualification for quality and reliability but sometimes our customers need us to undertake some investigative work to establish the level and mechanism of a specific failure.
We understand the importance of speed! Our standard turnaround time is five working days from receipt of sample devices. We regularly return tested samples faster than this - please check with us if your requirements are very urgent. We will initially check with you precisely what kind of testing you require. If you want us to do investigative work we will ensure that your detailed instructions are followed. If you simply want us to test to a particular standard we are very happy to advise on the pin combinations, parameters and quantity of samples we will need.
We will write a specific test plan for our automated test equipment and will agree this with you before commencing testing on request. A typical test plan would involve testing a sample of three new devices at each stress level and contain tests as follows:
We will record reference ESD waveforms before and after testing to assure you that the equipment was fully operational and within specification for the duration of the test. On completion of the testing we will collate the results we have obtained into a report which we will make available as a pdf file. We will also package up the raw files created by our tester (including results, curves etc.) onto a USB drive which we will send to you. We will upload the results package to our ftp site ot allow you online rapid access, on request.
We will package up and send back your parts as soon as practicable after the testing is completed, and certainly before the end of the next working day.
Standards which we can test to include: |
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HBM | Mil-Std 883G Method 3015.7 | (ISO17025) |
Mil-Std 883H Method 3015.8 | (ISO17025) | |
Mil-Std 883J Method 3015.9 | (ISO17025) | |
ANSI/ESDA/JEDEC JS-001-2023 | ||
ANSI/ESDA/JEDEC JS-001-2017 | (ISO17025) | |
ANSI/ESDA/JEDEC JS-001-2014 | (ISO17025) | |
ANSI/ESDA/JEDEC JS-001-2012 | (ISO17025) | |
ANSI/ESDA/JEDEC JS-001-2011 | (ISO17025) | |
ANSI/ESDA/JEDEC JS-001-2010 | (ISO17025) | |
EIA/JESD22-A114-F | (ISO17025) | |
AEC-Q100-002-REV-E | (ISO17025) | |
AEC-Q100-002-REV-D | (ISO17025) | |
AEC-Q101-001-REV-A | (ISO17025) | |
ANSI/ESD STM5.1-2007 | ||
ESCC Basic Specification No. 23800 | ||
FOTP-129 (GR 468) | ||
MM | EIA/JESD22-A115-A | (ISO17025) |
EIA/JESD22-A115-C | (ISO17025) | |
AEC-Q100-003 REV-E | (ISO17025) | |
AEC-Q101-002-REV-A | (Discretes) | |
ANSI/ESD STM5.2-2009 | ||
ANSI/ESD STM5.2-1999 | ||
CDM | ANSI/ESDA/JEDEC JS002-2022 | |
ANSI/ESDA/JEDEC JS002-2018 | (ISO17025) | |
ANSI/ESDA/JEDEC JS002-2014 | (ISO17025) | |
JESD22-C101F | (ISO17025) | |
JESD22-C101E | (ISO17025) | |
JESD22-C101D | (ISO17025) | |
JESD22-C101C | (ISO17025) | |
AEC-Q100-011 Rev-D | (ISO17025) | |
AEC-Q100-011 Rev-C1 | (ISO17025) | |
AEC-Q100-011 Rev-B | (ISO17025) | |
AEC-Q101-005-REV | (ISO17025) | |
ANSI/ESD STM5.3.1-2009 | ||
ANSI/ESD STM5.3.1-1999 | ||
Latch-Up | JESD78F | |
JESD78E | ||
JESD78D | ||
JESD78C | ||
JESD78B | ||
JESD78A | ||
JESD78 | ||
TLP | ESD TR5.5-01-08 | |
ANSI/ESD STM 5.5.1-2016 | ||
Note: | The latest standards will soon be ISO17025 accredited. Please ask if this is a critical requirement. |
We are accredited to UKAS ISO17025:2017, UKAS Testing Laboratory No. 4670 for the indicated testing standards and certified to ISO9001:2015 for the remainder.